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|ITEM METADATA RECORD
|Title: ||Investigation on the second optical inspection of ICS|
|Authors: ||Schreurs, G|
Oosterlinck, André #
|Issue Date: ||1985 |
|Host Document: ||vol:557 pages:132-139|
|Conference: ||SPIE, international conference on automatic inspection and measurement location:San Diego, California, USA date:August 20-21|
|Description: ||Proceedings SPIE, international conference on automatic inspection and measurement, vol. 557, pp. 132-139, August 20-21, 1985, San Diego, California, USA|
|Publication status: ||published|
|KU Leuven publication type: ||IC|
|Appears in Collections:||Radiology|
Electrical Engineering - miscellaneous
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