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Title: Investigation on the second optical inspection of ICS
Authors: Schreurs, G
Bellon, Erwin
Vercruyssen, M
Oosterlinck, André #
Issue Date: 1985
Host Document: vol:557 pages:132-139
Conference: SPIE, international conference on automatic inspection and measurement location:San Diego, California, USA date:August 20-21
Description: Proceedings SPIE, international conference on automatic inspection and measurement, vol. 557, pp. 132-139, August 20-21, 1985, San Diego, California, USA
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Radiology
Electrical Engineering - miscellaneous
# (joint) last author

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