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Title: Texture inspection with self-adaptive convolution filters
Authors: Dewaele, Piet ×
Van Gool, Luc
Wambacq, Patrick
Oosterlinck, André #
Issue Date: Nov-1988
Host Document: Proceedings 9th international conference on pattern recognition vol:1 pages:56-60
Conference: International conference on pattern recognition edition:9 location:Rome, Italy date:14-17 November 1988
Description: Dewaele P., Van Gool L., Wambacq P., Oosterlinck A., "Texture inspection with self-adaptive convolution filters", Proceedings 9th international conference on pattern recognition, vol. 1, pp. 56-60, November 14-17, 1988, Rome, Italy.
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT - PSI, Processing Speech and Images
× corresponding author
# (joint) last author

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