|ITEM METADATA RECORD
|Title: ||Screen characterization under fan induced swirl conditions|
|Authors: ||Nevelsteen, Koen|
De Troch, Kris
Nelemans, W #
|Issue Date: ||2003 |
|Host Document: ||Proceedings of the SEMITHERM XIX (Semiconductor Thermal Measurement and Management Symposium) pages:1-7|
|Conference: ||SEMITHERM XIX (Semiconductor Thermal Measurement and Management Symposium) location:San Jose, USA date:2003|
|Publication status: ||published|
|KU Leuven publication type: ||IC|
|Appears in Collections:||Applied Mechanics and Energy Conversion Section|
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