Title: Local determination of the stacking sequence of layered materials
Authors: Fompeyrine, J ×
Berger, R
Lang, HP
Perret, J
Machler, E
Gerber, C
Locquet, Jean-Pierre #
Issue Date: 1998
Series Title: Applied Physics Letters vol:72 issue:14 pages:1697-1699
Conference: date:IBM Corp, Div Res, Zurich Res Lab, CH-8803 Ruschlikon, Switzerland; Univ Bern, Inst Inorgan Chem, CH-3012 Bern, Switzerland; Univ Basel, Inst Phys, CH-4056 Basel, Switzerland; Univ Neuchatel, Inst Phys, CH-2000 Neuchatel, Switzerland
Abstract: The ability to modify the stacking sequence of ultrathin films offers a unique way to change either the interaction strength or the doping, but demands a careful control of each atomic monolayer. Progress is hampered by the lack of a direct method that allows differentiation on a local scale between the various terminating layers of a crystal. Here, the combination of a vacuum annealing process and friction force microscopy reveals this local distinction on a SrTiO3 surface. Using the friction contrast, we find how the terminating layer of a single crystal profoundly influences the terrace edge structure. (C) 1998 American Institute of Physics. [S0003-6951(98)01914-7].
ISSN: 0003-6951
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Solid State Physics and Magnetism Section
× corresponding author
# (joint) last author

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