Title: Growth and characterization of ferroelectric LaTiO3.5 thin films
Authors: Fompeyrine, J. ×
Seo, Jin Won
Locquet, Jean-Pierre #
Issue Date: 1999
Series Title: Journal of the European ceramic society vol:19 issue:6-7 pages:1493-1496
Conference: date:IBM Corp, Div Res, Zurich Res Lab, CH-8803 Ruschlikon, Switzerland; Univ Neuchatel, Inst Phys, CH-2000 Neuchatel, Switzerland
Abstract: Depending upon the oxygen content x, LaTiO3+x can be a semiconductor, a metal, or a ferroelectric at room temperature. Using a thin-film approach, it is in principle possible to adjust the oxygen content in the growth direction and thus tune the electronic properties within the same sample. We report here on a systematic study of the epitaxial growth of LaTiO3.5 films on SrTiO3 (110) substrates using molecular beam epitaxy. The epitaxial behaviour and the growth mechanism of these films have been investigated by means of X-ray diffraction, transmission electron microscopy, and in situ reflection high-energy electron diffraction analysis. (C) 1999 Elsevier Science Limited. All rights reserved.
ISSN: 0955-2219
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Solid State Physics and Magnetism Section
Physical Metallurgy and Materials Engineering Section (-)
× corresponding author
# (joint) last author

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