Title: Oxidation mechanism of LaTiO3.5 thin films
Authors: Seo, Jin Won ×
Fompeyrine, J
Siegwart, H
Locquet, Jean-Pierre #
Issue Date: 2001
Series Title: Physical review. B, Condensed matter vol:6320 issue:20
Conference: date:Univ Neuchatel, Inst Phys, CH-2000 Neuchatel, Switzerland; IBM Corp, Zurich Res Lab, Res, CH-8803 Ruschlikon, Switzerland
Article number: 205401
Abstract: LaTiO3.5 is a layered compound made up of four LaTiO3 units: two regular perovskite units stacked between two distorted units that share an additional oxygen layer. In a single-crystalline thin film the (100) plane can be aligned parallel to the substrate surface, i.e., the additional oxygen layers are inserted parallel to the substrate surface. A detailed structural characterization reveals planar defects originating from substrate surface steps. These results, in combination with the in situ reflection high-energy electron-diffraction observations, suggest an oxidation mechanism using such antiphase boundaries as oxidation paths.
ISSN: 0163-1829
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Solid State Physics and Magnetism Section
Physical Metallurgy and Materials Engineering Section (-)
× corresponding author
# (joint) last author

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