ITEM METADATA RECORD
Title: The characterization of thin films of MBE grown La2-xSrxCuO4+/-delta by transmission electron-microscopy
Authors: Williams, EJ ×
Locquet, Jean-Pierre
Machler, E
Jaccard, Y
Cretton, A
Broom, RF
Gerber, C
Schneider, T
Martinoli, P
Fischer, O #
Issue Date: 1993
Publisher: IOP PUBLISHING LTD
Series Title: Institute of Physics conference series issue:138 pages:329-332
Conference: date:UNIV GENEVA,DEPT PHYS MAT CONDENSEE,CH-1211 GENEVA,SWITZERLAND; UNIV NEUCHATEL,INST PHYS,CH-2000 NEUCHATEL,SWITZERLAND
Abstract: Thin films of La2CuOsimilar to 4, undoped and doped with Sr, and grown on (001)SrTiO3 were found to be epitaxial and to contain through film faults, misfit dislocations and deposition condition dependent second phases.
Description: ELECTRON MICROSCOPY AND ANALYSIS 1993
ISSN: 0951-3248
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Solid State Physics and Magnetism Section
× corresponding author
# (joint) last author

Files in This Item:

There are no files associated with this item.

Request a copy

 




All items in Lirias are protected by copyright, with all rights reserved.

© Web of science