The characterization of thin films of MBE grown La2-xSrxCuO4+/-delta by transmission electron-microscopy
Williams, EJ × Locquet, Jean-Pierre Machler, E Jaccard, Y Cretton, A Broom, RF Gerber, C Schneider, T Martinoli, P Fischer, O #
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Institute of Physics conference series issue:138 pages:329-332
date:UNIV GENEVA,DEPT PHYS MAT CONDENSEE,CH-1211 GENEVA,SWITZERLAND; UNIV NEUCHATEL,INST PHYS,CH-2000 NEUCHATEL,SWITZERLAND
Thin films of La2CuOsimilar to 4, undoped and doped with Sr, and grown on (001)SrTiO3 were found to be epitaxial and to contain through film faults, misfit dislocations and deposition condition dependent second phases.