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Title: Strontium concentration-dependence of the inplane penetration depth of superconducting La2-xSrxCuO4+/-delta very thin-films
Authors: Jaccard, Y ×
Cretton, A
Williams, EJ
Locquet, Jean-Pierre
Machler, E
Schneider, T
Fischer, O
Martinoli, P #
Issue Date: 1994
Publisher: ELSEVIER SCIENCE BV
Series Title: Physica. C, Superconductivity vol:235 issue:Part 3 pages:1811-1812
Conference: date:UNIV NEUCHATEL,INST PHYS,CH-2000 NEUCHATEL,SWITZERLAND; UNIV GENEVA,DEPT PHYS MAT CONDENSEE,CH-1211 GENEVA,SWITZERLAND
Abstract: Using a Molecular Beam Epitaxy deposition technique, c-axis oriented La2-xSrxCuO4+/-delta thin films (50nm thick) were prepared on (001) SrTiO3 substrates. Measurements of the ac sheet impedance Z = R + iwL(k) performed with a two coil mutual inductance technique were used to determine the temperature dependent in-place penetration depth lambda(ab)(T) of the layers for various values of their Sr content x. Values of lambda(ab)(0) deduced from the kinetic inductance L(k)(T) and from the vortex pinning activation energy Delta U show an increase of lambda(ab)(0) with growing carrier density n in the overdoped regime in sharp contrast with the simple London's prediction lambda(ab)(-2)(0) similar to n.
ISSN: 0921-4534
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Solid State Physics and Magnetism Section
× corresponding author
# (joint) last author

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