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Title: 3D-XY critical behavior in La2-xSrxCuO4 thin films probed by penetration depth measurement
Authors: Jaccard, Y ×
Schneider, T
Locquet, Jean-Pierre
Williams, EJ
Fischer, O
Martinoli, P #
Issue Date: 1996
Publisher: CZECHOSLOVAK JNL OF PHYSICS
Series Title: Czechoslovak Journal of Physics vol:46 issue:Suppl. 2 pages:1079-1080
Conference: date:IBM CORP,DIV RES,ZURICH RES LAB,CH-8803 RUSCHLIKON,SWITZERLAND; UNIV GENEVA,DEPT PHYS MAT CONDENSEE,CH-1211 GENEVA,SWITZERLAND
Abstract: We sketch the evidence for anisotropic 3D-XY critical behavior in La2-xSrxCuO4 thin films and explore the implications of this scenario, supplemented by the experimental phase transition line.*
ISSN: 0011-4626
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Solid State Physics and Magnetism Section
× corresponding author
# (joint) last author

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