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Chemistry of materials

Publication date: 1997-01-01
Pages: 127 - 134
Publisher: American Chemical Society

Author:

Fritsch, E
Machler, E ; Arrouy, F ; Orama, O ; Berke, H ; Povey, I ; Willmott, PR ; Locquet, Jean-Pierre

Keywords:

VAPOR-DEPOSITION, METAL BENZOYLPIVALOYLMETHANATES, OPTICAL-PROPERTIES, GROWTH, Y2O3, SYSTEM, Science & Technology, Physical Sciences, Technology, Chemistry, Physical, Materials Science, Multidisciplinary, Chemistry, Materials Science, 03 Chemical Sciences, 09 Engineering, Materials, 34 Chemical sciences, 40 Engineering

Abstract:

The new complex yttrium benzoylpivaloylmethanide and its acetonitrile adduct have been characterized by IR, NMR, mass spectroscopy, X-ray structure analysis, and thermogravimetric/differential thermal analysis. In situ flux measurements and mass spectroscopic studies have been performed to test the suitability of this compound as a precursor for the deposition of complex oxide thin films under molecular beam conditions. Finally it has been used to deposit epitaxial Y2O3 (001) thin films on SrTiO3 (001) substrates.