Journal of alloys and compounds

Publication date: 1997-01-01
Volume: 251 Pages: 11 - 14
Publisher: Elsevier

Author:

Williams, EJ
Daridon, A ; Arrouy, F ; Perret, J ; Jaccard, Y ; Locquet, Jean-Pierre ; Machler, E ; Siegenthaler, H ; Martinoli, P ; Fischer, O

Keywords:

transmission electron microscopy, defects, molecular beam epitaxy, oxide films, 0204 Condensed Matter Physics, 0912 Materials Engineering, 0914 Resources Engineering and Extractive Metallurgy, Materials, 4016 Materials engineering, 5104 Condensed matter physics

Abstract:

With a view to increasing the superconductive transition temperature of thin films of La2CuO4 grown by molecular beam epitaxy, films were grown on substrates of lattice parameters such that the film-substrate misfit became small and tensile, or compressive. The microstructure of these films was investigated using transmission electron microscopy and qualitative correlations with physical properties suggested.