Title: Geometrical priors in a Bayesian approach to improve wavelet threshold procedures
Authors: Jansen, Maarten
Bultheel, Adhemar #
Issue Date: 1999
Publisher: SPIE The International Society for Optical Engineering
Host Document: Wavelet Applications in Signal and Image Processing VII pages:580-590
Conference: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation location:Denver, Colorado, U.S.A. date:July 18-23, 1999
Abstract: Wavelet threshold algorithms replace wavelet coefficients with small magnitude by zero and keep or shrink the other coefficients. This is basically a local procedure, since wavelet coefficients characterize the local regularity of a function. Although a wavelet transform has decorrelating properties, structures in images, like edges, are never decorrelated completely, and these structures appear in the wavelet coefficients. We therefore introduce geometrical prior model for configurations of large wavelet coefficients and combine this with the local characterization of a classical threshold procedure into a Bayesian framework. The threshold procedure selects the large coefficients in the actual image. This observed configuration enters the prior model, which, by itself, only describes configurations, not coefficient values. In this way, we can compute for each coefficient the probability of being `sufficiently clean'.
Description: Proc. of SPIE, Volume 3813
Publication status: published
KU Leuven publication type: IC
Appears in Collections:NUMA, Numerical Analysis and Applied Mathematics Section
# (joint) last author

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