Title: Short-interval test-retest interrater reliability of the Dutch version of the structured clinical interview for DSM-IV personality disorders (SCID-II)
Authors: Weertman, A ×
ArntZ, A
Dreessen, L
van Velzen, C
Vertommen, Stefaan #
Issue Date: Dec-2003
Publisher: Guilford publications inc
Series Title: Journal of personality disorders vol:17 issue:6 pages:562-567
Abstract: This study examined the short-interval test-retest reliability of the Structured Clinical Interview (SCID-II: First, Spitzer, Gibbon, & Williams, 1995) for DSM-IV personality disorders (PDs). The SCID-II was administered to 69 in- and outpatients on two occasions separated by 1 to 6 weeks. The interviews were conducted at three sites by ten raters. Each rater acted as first and as second rater and equal number of times. The test-retest interrater reliability for the presence or absence of any PD was fair to good (kappa = .63) and was higher than values found in previous short-interval test-retest studies with the SCID-II for DSM-III-R. Test-retest reliability coefficients for trait and sumscores were sufficient, except for dependent PD. Values for single criteria were variable, ranging from poor to good agreement. Further large-scale test-retest research is needed to test the interrater reliability of more categorical diagnoses and single traits.
ISSN: 0885-579X
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Onderzoeksgroep psychodiagnostiek en psychopathologie (-)
× corresponding author
# (joint) last author

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