Title: Multiple wavelet threshold estimation by generalized cross validation for images with correlated noise
Authors: Jansen, Maarten ×
Bultheel, Adhemar #
Issue Date: Jul-1999
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE transactions on image processing vol:8 issue:7 pages:947-953
Abstract: Denoising algorithms based on wavelet thresholding replace small wavelet coefficients by zero and keep or shrink the coefficients with absolute value above the threshold. The optimal threshold minimizes the error of the result as compared to the unknown, exact data. To estimate this optimal threshold, we use generalized cross validation. This procedure does not require an estimation for the noise energy. Originally, this method assumes uncorrelated noise. In this paper, we describe how we can extend it to images with correlated noise.
ISSN: 1057-7149
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Numerical Analysis and Applied Mathematics Section
× corresponding author
# (joint) last author

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