Title: Empirical Bayes approach to improve wavelet thresholding for image noise reduction
Authors: Jansen, Maarten ×
Bultheel, Adhemar #
Issue Date: Jun-2001
Publisher: American Statistical Association
Series Title: Journal of the American Statistical Association vol:96 issue:454 pages:629-639
Abstract: Wavelet threshold algorithms replace small magnitude wavelet coefficients with zero and keep or shrink the other coefficients. This is basically a local procedure, because wavelet coefficients characterize the local regularity of a function. Although a wavelet transform has decorrelating properties, structures in images, like edges, are never decorrelated completely, and these structures appear in the wavelet coefficients: a classification based on a local criterion-like coefficient magnitude is not the perfect method to distinguish important, uncorrupted coefficients from coefficients dominated by noise. We therefore introduce a geometrical prior model for configurations of important wavelet coefficients and combine this with local characterization of a classical threshold procedure into a Bayesian framework. The local characterization is incorporated into the conditional model, whereas the prior model describes only configurations, not coefficient values. More precisely, local characterization favors configurations with clusters of important coefficients. In this way, we can compute, for each coefficient, the posterior probability of being "sufficiently clean."

ISSN: 0162-1459
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Numerical Analysis and Applied Mathematics Section
× corresponding author
# (joint) last author

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