Title: Wrapped feature selection by means of guided neural network optimization
Authors: Baesens, Bart
Viaene, Stijn
Vanthienen, Jan
Dedene, Guido #
Issue Date: 2000
Conference: 15th International Conference on Pattern Recognition (ICPR) location:Barcelona (Spain) date:3-8 September 2000
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Research Center for Management Informatics (LIRIS), Leuven
# (joint) last author

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