Title: Developing patent-related indicators for the assessment of scientific excellende in industrial relevant fields
Authors: Debackere, Koenraad
Van Looy, Bart #
Issue Date: 2002
Host Document: Proceedings of the 2002 R&D Management Conference pages:CD-Rom
Conference: R&D Management Conference location:Leuven (Belgium) date:8-9 July 2002
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Department of Managerial Economics, Strategy and Innovation (MSI), Leuven
# (joint) last author

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