Author:

Keywords:

Science & Technology, Technology, Physical Sciences, Engineering, Electrical & Electronic, Nanoscience & Nanotechnology, Optics, Physics, Applied, Engineering, Science & Technology - Other Topics, Physics, Equivalent circuit model, FinFET, Intermodulation distortion, Two-tone measurements, MOSFETS, IMD, 0204 Condensed Matter Physics, 0299 Other Physical Sciences, 0906 Electrical and Electronic Engineering, Applied Physics, 4009 Electronics, sensors and digital hardware, 4016 Materials engineering

Abstract:

The goal of this paper is to demonstrate the added value of vector two-tone measurements in validating a microwave transistor model. By having the phase information of the low frequency intermodulation products, the model can be evaluated completely both in frequency and time domain. The approach is illustrated on a non-dispersive FinFET. © 2009 Elsevier B.V. All rights reserved.