Conference on Optical and Infrared Interferometry and Imaging IX, Date: 2024/06/17 - 2024/06/22, Location: JAPAN, Yokohama
Publication date:
2024-01-01
Volume:
13095
ISSN:
978-1-5106-7513-1
DOI:
10.1117/12.3017506
Publisher:
Society of Photo-optical Instrumentation Engineers
OPTICAL AND INFRARED INTERFEROMETRY AND IMAGING IX
Author:
Martinod, Marc-Antoine
Defrere, Denis ; Laugier, Romain ; Ertel, Steve ; Absil, Olivier ; Norris, Barnaby ; Garreau, Germain ; Mennesson, Bertrand ; Kammerer, J ; Sallum, S ; Sanchez-Bermudez, J
Keywords:
Science & Technology, Physical Sciences, Technology, Astronomy & Astrophysics, Instruments & Instrumentation, Optics, signal processing, high contrast imaging, high angular resolution, optimisation, model fitting, universal, self-calibration, statistical analysis, ORP - 101004719;info:eu-repo/grantAgreement/EC/H2020/101004719, ERC SCIFY - 866070;info:eu-repo/grantAgreement/EC/H2020/866070, 1234224N#57600210, 4006 Communications engineering, 4009 Electronics, sensors and digital hardware, 5102 Atomic, molecular and optical physics