Microelectronics Reliability

Publication date: 2012-01
Volume: 52 Pages: 2677 - 2684
ISSN: 0026-2714, 1872-941X
DOI: 10.1016/j.microrel.2012.06.024
Publisher: Elsevier

Author:

Ivankovic, Andrej
Vanstreels, Kris ; Vanderstraeten, Daniel ; Brizar, Guy ; Gillon, Renaud ; Blansaer, Eddy ; Vandevelde, Bart

Keywords:

Science & Technology, Technology, Physical Sciences, Engineering, Electrical & Electronic, Nanoscience & Nanotechnology, Physics, Applied, Engineering, Science & Technology - Other Topics, Physics, 0906 Electrical and Electronic Engineering, Applied Physics