IEEE International Reliability Physics Symposium - IRPS, Date: 2011/04/10 - 2011/04/14, Location: Monterey, CA USA

Publication date: 2011-04
Publisher: IEEE

2011 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS)

Author:

Grasser, Tibor
Aichinger, Thomas ; Pobegen, Gregor ; Reisinger, Hans ; Wagner, Paul-Jurgen ; Franco, Jacopo ; Nelhiebel, M ; Kaczer, Ben

Keywords:

Science & Technology, Technology, Engineering, Electrical & Electronic, Engineering, BIAS TEMPERATURE INSTABILITY, DEFECT REACTIONS, TIME-DEPENDENCE, INTERFACE, RECOMBINATION, DEGRADATION, RECOVERY, TRAP