4th International Conference on Advances in Experimental Mechanics Singapore, SINGAPORE, NOV 18-20, 2009

Publication date: 2010-01
Volume: 7522 Pages: 721 - 725
ISBN: 978-0-8194-7912-9 ISSN: 0277-786X
DOI: 10.1117/12.851666
Publisher: Spie-int soc optical engineering; 1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA

Fourth international conference on experimental mechanics

Author:

Buytaert, Jan
Dirckx, Joris JJ

Keywords:

optical demodulation, liquid crystal, light modulators, projection moire, membrane elasticity, profilometry

Abstract:

Structured light projection techniques are an important and popular approach for whole-field surface topography. Within this branch, projection moire interferometry is our preferred optical metrology method.