IEEE International Conference on Microelectronic Test Structures - ICMTS, Date: 2010/01/23 - 2010/01/23, Location: Hiroshima Japan

Publication date: 2010-01
Pages: 80 - 85
ISBN: 978-1-4244-6915-4 ISSN: 1071-9032
DOI: 10.1109/ICMTS.2010.5466852
Publisher: IEEE

Proceedings of the IEEE International Conference on Microelectronic Test Structures - ICMTS

Author:

Smith, S
Brockie, NL ; Murray, J ; Wilson, Chris ; Horsfall, AB ; Terry, JG ; Stevenson, JTM ; Mount, AR ; Walton, AJ

Keywords:

Science & Technology, Technology, Engineering, Electrical & Electronic, Nanoscience & Nanotechnology, Engineering, Science & Technology - Other Topics