American Control Conference (ACC), Date: 2012/06/27 - 2012/06/29, Location: Montreal: CANADA

Publication date: 2012-01
Pages: 258 - 263
ISBN: 978-1-4577-1096-4 ISSN: 0743-1619, 2378-5861
Publisher: IEEE COMPUTER SOC; LOS ALAMITOS

2012 AMERICAN CONTROL CONFERENCE (ACC)

Author:

Biemond, Benjamin
van de Wouw, N ; Heemels, WPMH ; Nijmeijer, H

Keywords:

Science & Technology, Technology, Automation & Control Systems, Engineering, Electrical & Electronic, Engineering